MS-100D DIE Tester

CST Inc., a Memory Tester Company has announced its New MS-100D DIE Sorting Tester and have started deploying hundreds of units at several major DIE Sorting Manufacturers world-wide. MS-100D has a very good architecture, with different probe card the same tester is able to test almost all DRAM DIE on the market, specially Mobile Low Power DRAM: LPDDR2, LPDDR3 & LPDDR4.

For further information, please contact our Sales team.
Tel : (852)-3412-3412
Fax : (852)3412-3338
Email : info@aforce.com

This site uses cookies to offer you a better browsing experience. By browsing this website, you agree to our use of cookies.